Focused Ion Beam Scanning Electron Microscope
Original notice title
Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Opportunity Score
Why this score?
Opportunity
68 / 100
Complexity
42 / 100
Risk factors
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Submission deadline in 8 days
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications
Overview
Strong opportunityKey Facts
- SEK 28M estimated value
- Supplies contract
- 1 lot
- Duration until Mar 2028
- Supply of a Focused Ion Beam, Scanning Electron Microscope (FIB-SEM).
- Instrument to be used for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV.
Show full summary
Open supply tender by Lunds universitet for one FIB-SEM instrument (Focused Ion Beam, Scanning Electron Microscope) for Lund Nano Lab. The contract value is SEK 28,000,000 and electronic submission is required. The notice and XML are consistent on scope, procedure, and deadline; no extracted procurement document text beyond the XML notice was provided, so detailed technical requirements are not analyzed here.
Risks
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Submission deadline in 8 days
Analysis may be incomplete
Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.
Key Requirements
Technical
- Contract nature is supplies.
Administrative
- Electronic submission is required.
- Tender language is English.
Award Criteria
Lot 1
Buyer
Location
Lund, SWE
Website
Buyer profile
Identifier
202100-3211
Activity
Education
Lots (1)
LOT-0001
Focused Ion Beam Scanning Electron Microscope
Supply of one Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) for Lund Nano Lab at Lund University, intended for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV. Place of performance is Sweden, region SE224 (Lund area).
EUR 2.5M
Estimated value
Location
Duration
Category
Award Criteria
Deadline
Award details
Price
Additional CPV codes
Value note
Show original TED data
Original lot title
Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Original TED description
.
Procurement Details
- Publication date
- 01 Jul 2026
- Languages
- English
Reference metadata
- Legal basis
- 32014L0024
Reference IDs
- Tender ID
- 456632-2026
Documents (1)
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Opportunity Score
Why this score?
Opportunity
68 / 100
Complexity
42 / 100
Risk factors
The notice references procurement documents, but no separate extracted procurement document text was provided for analy...
The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...
Submission deadline in 8 days
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications