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Focused Ion Beam Scanning Electron Microscope

Lunds universitet·Lund, Sweden·SEK 28M | EUR 2.5M·Deadline Aug 24, 2026 · 8 days left·Open·Supplies
High value
Original notice title

Sweden – Scanning electron microscopes – Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)

68/100

Opportunity Score

PromisingMedium complexity
SuppliesOpen
Why this score?

Opportunity

68 / 100

Complexity

42 / 100

Risk factors

The notice references procurement documents, but no separate extracted procurement document text was provided for analy...

The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...

Submission deadline in 8 days

Deep Portfolio Analysis

Deep Company Fit Analysis

Uses:

  • Description
  • Industries & Services
  • Capabilities
  • Market & Experience
  • Certifications

Overview

Strong opportunity

Key Facts

  • SEK 28M estimated value
  • Supplies contract
  • 1 lot
  • Duration until Mar 2028
  • Supply of a Focused Ion Beam, Scanning Electron Microscope (FIB-SEM).
  • Instrument to be used for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV.
Show full summary

Open supply tender by Lunds universitet for one FIB-SEM instrument (Focused Ion Beam, Scanning Electron Microscope) for Lund Nano Lab. The contract value is SEK 28,000,000 and electronic submission is required. The notice and XML are consistent on scope, procedure, and deadline; no extracted procurement document text beyond the XML notice was provided, so detailed technical requirements are not analyzed here.

Risks

The notice references procurement documents, but no separate extracted procurement document text was provided for analy...

The instrument must meet requirements listed in the procurement documents, but those detailed requirements are not visi...

Submission deadline in 8 days

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

Technical

  • Contract nature is supplies.

Administrative

  • Electronic submission is required.
  • Tender language is English.

Award Criteria

Lot 1

Price criterion; weight not stated.

Buyer

Location

Lund, SWE

Website

www.lu.se/

Buyer profile

Open profile

Identifier

202100-3211

Activity

Education

Lots (1)

LOT-0001

Focused Ion Beam Scanning Electron Microscope

Supply of one Focused Ion Beam, Scanning Electron Microscope (FIB-SEM) for Lund Nano Lab at Lund University, intended for high-resolution imaging, materials analysis, TEM sample preparation, and experiments at MAX IV. Place of performance is Sweden, region SE224 (Lund area).

SuppliesEU fundedElectronic submission

EUR 2.5M

Estimated value

Location

SE224, Sweden

Duration

Sep 2026 - Mar 2028

Category

Scanning electron microscopes

Award Criteria

Price

Deadline

Deadline Aug 24, 2026

Procurement Details

Publication date
01 Jul 2026
Languages
English

Reference metadata

Legal basis
32014L0024

Reference IDs

Tender ID
456632-2026

Documents (1)

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